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Investigation of the Impact of External Stress on Memory Characteristics by Modifying the Backside of SubstrateGo to Link

Oh, Young-Taek; Sim, Jae-Min; Nguyen Van Toan; Kino, Hisashi; Ono, Takahito; Tanaka, Tetsu; Song, Yun Heub

ArticleIssue Date2019CitationIEEE Transactions on Electron Devices, v.66, no.4, pp 1741 - 1746PublisherInstitute of Electrical and Electronics Engineers
SCISCIESCOPUS
The Effect of Mechanical Stress on Cell Characteristics in MONOS StructuresGo to Link

Oh, Young-Taek; Roh, Ii-Pyo; Kino, Hisashi; Tanaka, Tetsu; Song, Yun Heub

ArticleIssue Date2018CitationIEEE Transactions on Electron Devices, v.65, no.10, pp 4313 - 4319PublisherInstitute of Electrical and Electronics Engineers
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