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A Superposed Log-Linear Failure Intensity Model for Repairable Artillery SystemsGo to Link

Mun, Byeong Min; Bae, Suk Joo; Kvam, Paul H.

ArticleIssue Date2013CitationJournal of Quality Technology, v.45, no.1, pp 100 - 115PublisherAmerican Society of Quality
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Degradation models and implied lifetime distributionsGo to Link

Bae, Suk Joo; Kuo, Way; Kvam, Paul H.

ArticleIssue Date2007CitationReliability Engineering and System Safety, v.92, no.5, pp 601 - 608PublisherElsevier BV
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Discussion of 'Stochastic modelling and analysis of degradation for highly reliable products'Go to Link

Bae, Suk Joo; Kvam, Paul H.

ArticleIssue Date2015CitationApplied Stochastic Models in Business and Industry, v.31, no.1, pp 33 - 34PublisherJohn Wiley & Sons Inc.
SCIESCOPUS
Statistical models for hot electron degradation in nano-scaled MOSFET devicesGo to Link

Bae, Suk Joo; Kim, Seong-Joon; Kuo, Way; Kvam, Paul H.

ArticleIssue Date2007CitationIEEE Transactions on Reliability, v.56, no.3, pp 392 - 400PublisherInstitute of Electrical and Electronics Engineers
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