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SCIESCOPUS
Degradation and Recovery in HZO-Based FeFETs under Hydrogen and Thermal Stress for CMOS IntegrationGo to Link

Han, Changhyeon; Kwak, Been; Yoo, Yelin; Kwak, Sangeun; Kwon, Daewoong

ArticleIssue Date2026CitationACS Applied Electronic Materials, v.8, no.3, pp 1173 - 1180PublisherAmerican Chemical Society
SCIESCOPUS
Memory Window Expansion in HfO2-Based FeFETs Through Trap-to-Dipole ConversionGo to Link

Han, Changhyeon; Kwak, Been; Kim, Hyun-Min; Kwak, Sangeun; Kwon, Daewoong

ArticleIssue Date2026CitationIEEE ELECTRON DEVICE LETTERS, v.47, no.5, pp 905 - 908PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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