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Dependence of memory margin of Cap-less memory cells on top Si thicknessGo to Link

Choi, Ki-Ryoung; Lee, Choong-Hyun; Kim, Seong-Je; Enomoto, Hirofumi; Shim, Tae-Hun; Cho, Won-Ju; Park, Jea-Gun

ArticleIssue Date2009CitationApplied Physics Letters, v.94, no.2, pp 1 - 3PublisherAmerican Institute of Physics
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