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The Effects of a Thermal Recovery Process in In-Ga-Zn-O (IGZO) Thin Films Transistor

Park, Hyung-Youl; Yoo, Gwangwe; Lee, Hanjae; Lim, Myung-Hoon; Baek, Jung Woo; Choi, Changhwan; Park, Jin-Hong

ArticleIssue Date2016CitationJournal of Nanoscience and Nanotechnology, v.16, no.11, pp 11509 - 11512PublisherAmerican Scientific Publishers
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