ScholarWorks@Hanyang University

Browsing by Ling, Man HoAuthor

All A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

Showing results 1 to 3 of 3

SCIESCOPUS
An Extended Gamma Process for Accelerated Destructive Degradation Test: Modeling and Optimal DesignGo to Link

Ling, Man Ho; Bae, Suk Joo; Jin, Shengxin; Ng, Hon Keung Tony

ArticleIssue Date2025CitationIEEE Transactions on Reliability, v.74, no.3, pp 4387 - 4401PublisherInstitute of Electrical and Electronics Engineers
SCIESCOPUS
On the application of inverted Dirichlet distribution for reliability inference of completely censored components with dependence structureGo to Link

Ling, Man Ho; Balakrishnan, Narayanaswamy; Bae, Suk Joo

ArticleIssue Date2024CitationComputers and Industrial Engineering, v.196, pp 1 - 11PublisherElsevier Ltd
SCOPUS
Statistical inference and optimal design for step-stress accelerated life testing with hybrid group censoring for non-destructive one-shot devicesGo to Link

Ling, Man Ho; Cramer, Erhard; Bae, Sukjoo

ArticleIssue Date2026CitationReliability Engineering and System Safety, v.265, pp 1 - 11PublisherElsevier BV
1
CONTACT US

RSS_1.0 RSS_2.0 ATOM_1.0

222, Wangsimni-ro, Seongdong-gu, Seoul, 04763, Korea+82-2-2220-1366

COPYRIGHT © 2024 HANYANG UNIVERSITY.

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

BROWSE

한국어