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Defect passivation of hafnium oxide ferroelectric tunnel junction using forming gas annealing for neuromorphic applicationsGo to Linkopen access

Nguyen, Manh-Cuong; Min, Kyung Kyu; Shin, Wonjun; Yim, Jiyong; Choi, Rino; Kwon, Daewoong

ArticleIssue Date2025CitationNano Convergence, v.12, no.1, pp 1 - 12Publisher나노기술연구협의회
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Effects of Charge Imbalance on Field-Induced Instability of HfO2-Based Ferroelectric Tunnel JunctionsGo to Linkopen access

Shin, Wonjun; Han, Chang-Hyeon; Kim, Jangsaeng; Koo, Ryun-Han; Min, Kyung Kyu; Kwon, Daewoong

ArticleIssue Date2025CitationAdvanced Electronic Materials, v.11, no.2, pp 1 - 9PublisherJohn Wiley and Sons Inc
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Effects of temperature and DC cycling stress on resistive switching mechanisms in hafnia-based ferroelectric tunnel junctionGo to Link

Shin, Wonjun; Koo, Ryun-Han; Min, Kyung Kyu; Kwak, Been; Kwon, Dongseok; Kwon, Daewoong; Lee, Jong-Ho

ArticleIssue Date2023CitationApplied Physics Letters, v.122, no.15, pp 1 - 6PublisherAmerican Institute of Physics
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