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Enhanced Reliability of High-Quality a-IGZO TFTs for Micro-LED Backplanes: Mitigating VTH Instability at Elevated Temperatures

Moon, Tae Woong; Yoon, Seong Hun; Chung, Ui Jin; Park, Sang Yoon; Jeong, Jae Kyeong

ArticleIssue Date2025CitationACS Applied Materials & Interfaces, v.17, no.9, pp 14201 - 14210PublisherAmerican Chemical Society
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