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Impact of etch angles on cell characteristics in 3D NAND flash memoryGo to Link

Oh, Young-Taek; Kim, Kyu-Beom; Shin, Sang-Hoon; Sim, Hahng; Toan, Nguyen Van; Ono, Takahito; Song, Yun Heub

ArticleIssue Date2018CitationMicroelectronics Journal, v.79, pp 1 - 6PublisherElsevier BV
SCIESCOPUS
Impact of Grain Length and Grain Boundary on Dispersion of Threshold Voltage for 3-Dimensional Gate-All-Around Polysilicon Channel MemoryGo to Link

Kim, Kyu-Beom; Oh, Young-Taek; Song, Yun-Heub

ArticleIssue Date2017CitationJournal of Nanoscience and Nanotechnology, v.17, no.12, pp 9257 - 9261PublisherAmerican Scientific Publishers
SCIESCOPUS
Investigation of the Effect of Grain for Vertically Stacked NAND Flash Memory with a Poly-GaAs ChannelGo to Link

Oh, Young-Taek; Shin, Sang-Hoon; Kim, Kyu-Beom; Song, Yun-Heub

ArticleIssue Date2017CitationNanoscience and Nanotechnology Letters, v.9, no.5, pp 736 - 740PublisherAmerican Scientific Publishers
SCISCIESCOPUS
Investigation of the Impact of External Stress on Memory Characteristics by Modifying the Backside of SubstrateGo to Link

Oh, Young-Taek; Sim, Jae-Min; Nguyen Van Toan; Kino, Hisashi; Ono, Takahito; Tanaka, Tetsu; Song, Yun Heub

ArticleIssue Date2019CitationIEEE Transactions on Electron Devices, v.66, no.4, pp 1741 - 1746PublisherInstitute of Electrical and Electronics Engineers
SCISCIESCOPUSKCI
Simulation of Residual Stress and Its Impact on a Poly-Silicon Channel for Three-Dimensional, Stacked, Vertical-NAND Flash MemoriesGo to Link

Kim, Kyu-Beom; Oh, Young-Taek; Song, Yun-Heub

ArticleIssue Date2017CitationJournal of the Korean Physical Society, v.70, no.12, pp 1041 - 1048Publisher한국물리학회
SCISCIESCOPUS
Temperature dependence of reliability characteristics for magnetic tunnel junctions with a thin MgO dielectric filmGo to Link

Choi, Chul-Min; Oh, Young-Taek; Kim, Kyung-Jun; Park, Jin-Suk; Sukegawa, Hiroaki; Mitani, Seiji; Kim, Sung-Kyu; Lee, Jeong-Yong; Song, Yun-Heub

ArticleIssue Date2016CitationSemiconductor Science and Technology, v.31, no.7, pp 1 - 10PublisherInstitute of Physics Publishing
SCISCIESCOPUS
The Effect of Mechanical Stress on Cell Characteristics in MONOS StructuresGo to Link

Oh, Young-Taek; Roh, Ii-Pyo; Kino, Hisashi; Tanaka, Tetsu; Song, Yun Heub

ArticleIssue Date2018CitationIEEE Transactions on Electron Devices, v.65, no.10, pp 4313 - 4319PublisherInstitute of Electrical and Electronics Engineers
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