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SCIESCOPUS
Effect of Hydrogen Profile in Flash Memory SiNx Charge Trap Layer with Different Silicon to Nitrogen RatiosGo to Linkopen access

Choi, Sehyeon; Lim, Yunseo; Kim, Sejin; Park, San; Ku, Boncheol; Kim, Hyungjun; Yang, Jaehyun; Kim, Bio; Son, Youngseon; Choi, Hanmei, et al.

ArticleIssue Date2025CitationAdvanced Electronic Materials, v.11, no.15, pp 1 - 9PublisherWiley-VCH Verlag
SCIESCOPUS
Influence of chlorine on the memory characteristics of MONOS device with Plasma-Enhanced atomic layer deposited Si3N4 charge trap layerGo to Link

Kim, Sejin; Choi, Sehyeon; Park, San; Ku, Boncheol; Kim, Hyungjun; Lim, Yun Seo; Park, Ji Su; Yang, Jaehyun; Kim, Bio; Son, Youngseon, et al.

ArticleIssue Date2025CitationApplied Surface Science, v.698, pp 1 - 8PublisherElsevier BV
SCIESCOPUS
Reliability improvement of Ge2Sb2Te5-based phase-change memory devices with increased post annealing timeGo to Link

Park, San; Park, Jisu; Kim, Sunbum; Park, Junwoo; Jung, Pilseong; Ji, Sanghyun; Choi, Changhwan

ArticleIssue Date2025CitationApplied Surface Science, v.702, pp 1 - 12PublisherElsevier BV
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