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Lifetime Prediction of DC-Link Film Capacitors using a Stochastic Model Combined by Random Variable and Gamma ProcessGo to Link

Shin, Seok-san; Ham, Hyeongjin; Lee, Hyeong cheol

ArticleIssue Date2014CitationSAE International Journal of Passenger Cars - Electronic and Electrical Systems, v.7, no.2, pp 544 - 551PublisherSociety of Automotive Engineers
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