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SCIESCOPUS
A novel observation of negative differential resistance in a standard CMOS transistor and its application to a compact frequency doublerGo to Linkopen access

Kwak, Been; Cho, Youngchan; Han, Changhyeon; Lee, Jongwoo; Kim, Sangwan; Shin, Yunho; Choi, Joonhyeok; Kim, Dongbin; Lee, Seung June; Lee, Seunghoo, et al.

ArticleIssue Date2026CitationMICROSYSTEMS & NANOENGINEERING, v.12, no.1, pp 1 - 14PublisherSPRINGERNATURE
SCIESCOPUS
Front-Side NMOS Connection as the Preferred Scheme: Quantifying the ~10× Resistance Limit of NMOS-Backside in DBC 3DSFET SRAMGo to Linkopen access

Shin, Yunho; Kang, Duckseoung; Kwon, Daewoong; Myeong, Ilho

ArticleIssue Date2026CitationIEEE ACCESS, v.14, pp 27374 - 27380PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
In Materia Shaping of Randomness with a Standard Complementary Metal-Oxide-Semiconductor Transistor for Task-Adaptive Entropy GenerationGo to Linkopen access

Kwak, Been; Koo, Ryun-Han; Cho, Youngchan; Han, Changhyeon; Kim, Dongbin; Jeong, Soi; Shin, Yunho; Choi, Joonhyeok; Im, Jiseong; Ko, Jonghyun, et al.

ArticleIssue Date2026CitationADVANCED FUNCTIONAL MATERIALS, v.36, no.23, pp 1 - 14PublisherWILEY-V C H VERLAG GMBH
SCIESCOPUS
In Situ Transmission Electron Microscopy Visualization of Electric-Field-Induced Phase Transitions at the Morphotropic Phase Boundary in Hf0.5Zr0.5O2Go to Link

Lee, Sanghyo; Kim, Sojin; Ryu, Jinseok; Lee, Jaewook; Hong, Jinseok; Kim, Ji Eun; Cha, Ju-Young; Shin, Yunho; Kwon, Daewoong; Yoon, Jung Ho, et al.

ArticleIssue Date2026CitationACS NANO, v.20, no.8, pp 6757 - 6766PublisherAMER CHEMICAL SOC
SCIESCOPUS
Repurposing Si CMOS nonidealities for stochastic and analog image processingGo to Linkopen access

Kwak, Been; Koo, Ryun-Han; Han, Changhyeon; Shin, Yunho; Choi, Joonhyeok; Kim, Dongbin; Lee, Jongwoo; Im, Jiseong; Cho, Youngchan; Lee, Jong-Ho, et al.

ArticleIssue Date2026CitationSCIENCE ADVANCES, v.12, no.8, pp 1 - 11PublisherAMER ASSOC ADVANCEMENT SCIENCE
SCIESCOPUS
The Impact of Through Silicon Metal(TSM) contact on Performance and thermal reliability in CFETGo to Link

Shin, Yunho; Kwak, Been; Myeong, Ilho; Kwon, Daewoong

ArticleIssue Date2025CitationIEEE Electron Device Letters, v.46, no.10, pp 1897 - 1900PublisherInstitute of Electrical and Electronics Engineers
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