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Exceptional Immunity of Drain-Induced Barrier Lowering Effect in a-IGZTO Transistors via Favorable Coupling Effects of Metal-H BondingGo to Link

Kim, Gwang-Bok; Kim, Se Eun; Kim, Yena; Son, Kyeong-Seok; Park, Joon Seok; Lee, Sunhee; Jeong, Jae Kyeong

ArticleIssue Date2024CitationIEEE Electron Device Letters, v.45, no.11, pp 2130 - 2133PublisherInstitute of Electrical and Electronics Engineers
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