Fay, Patrick; Cao, Yu; Chang, Josephine; Jeong, Jae-Kyeong; Meneghini, Matteo; Shi, Junxia; Tiku, Shiban
ArticleIssue Date2020CitationIEEE Transactions on Electron Devices, v.67, no.10, pp 3922 - 3924PublisherInstitute of Electrical and Electronics Engineers