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Reliability Prediction of Gate Dielectrics Based on Percolation Models Using Fractal Structure
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 배석주 | - |
| dc.date.accessioned | 2021-08-02T09:57:12Z | - |
| dc.date.available | 2021-08-02T09:57:12Z | - |
| dc.date.created | 2021-06-30 | - |
| dc.date.issued | 2019-11-27 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/11230 | - |
| dc.publisher | The Korean Society of Mechanical Engineers | - |
| dc.title | Reliability Prediction of Gate Dielectrics Based on Percolation Models Using Fractal Structure | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | 배석주 | - |
| dc.identifier.bibliographicCitation | 5th International Conference on Materials and Reliability | - |
| dc.relation.isPartOf | 5th International Conference on Materials and Reliability | - |
| dc.citation.title | 5th International Conference on Materials and Reliability | - |
| dc.citation.conferencePlace | Jeju Island, Korea | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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Collections - 서울 공과대학 > 서울 산업공학과 > 2. Conference Papers
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Related Researcher
- Bae, Suk Joo
- COLLEGE OF ENGINEERING (DEPARTMENT OF INDUSTRIAL ENGINEERING)