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Reliability issue by Vpass induced carrier injection phenomenon in 3D NAND Flash memory
- Authors
- 송윤흡
- Issue Date
- 19-Nov-2019
- Place
- 한양대학교
- Conference Name
- 한국반도체디스플레이기술학회 추계학술대회
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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Related Researcher
- Song, Yun Heub
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)