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Grad-CAM(Gradient-Class Activation Map)을 이용한 웨이퍼 빈 맵 복합 불량 패턴 분해
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 배석주 | - |
| dc.date.accessioned | 2022-02-09T04:17:48Z | - |
| dc.date.available | 2022-02-09T04:17:48Z | - |
| dc.date.issued | 2021-05-21 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/135074 | - |
| dc.title | Grad-CAM(Gradient-Class Activation Map)을 이용한 웨이퍼 빈 맵 복합 불량 패턴 분해 | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 2021년 한국품질경영학회 춘계학술대회 | - |
| dc.citation.conferencePlace | 온라인 | - |
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Collections - 서울 공과대학 > 서울 산업공학과 > 2. Conference Papers
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Related Researcher
- Bae, Suk Joo
- COLLEGE OF ENGINEERING (DEPARTMENT OF INDUSTRIAL ENGINEERING)