Bayesian modeling approach for predicting residual life of two-phase degradation
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Bae, S.J. | - |
dc.contributor.author | Yuan, T. | - |
dc.contributor.author | Ling, S. | - |
dc.contributor.author | Kuo, W. | - |
dc.date.accessioned | 2022-04-01T09:56:41Z | - |
dc.date.available | 2022-04-01T09:56:41Z | - |
dc.date.created | 2022-03-10 | - |
dc.date.issued | 2012-05-19 | - |
dc.identifier.issn | 0000-0000 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/136480 | - |
dc.description.abstract | [No abstract available] | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | Institute of Industrial Engineers | - |
dc.title | Bayesian modeling approach for predicting residual life of two-phase degradation | - |
dc.type | Conference | - |
dc.contributor.affiliatedAuthor | Bae, S.J. | - |
dc.identifier.scopusid | 2-s2.0-84900305564 | - |
dc.identifier.bibliographicCitation | 62nd IIE Annual Conference and Expo 2012 | - |
dc.relation.isPartOf | 62nd IIE Annual Conference and Expo 2012 | - |
dc.relation.isPartOf | 62nd IIE Annual Conference and Expo 2012 | - |
dc.citation.title | 62nd IIE Annual Conference and Expo 2012 | - |
dc.citation.conferencePlace | US | - |
dc.citation.conferencePlace | Orlando, FL | - |
dc.citation.conferenceDate | 2012-05-19 | - |
dc.type.rims | CONF | - |
dc.description.journalClass | 1 | - |
dc.identifier.url | https://www.iise.org/annual2/Annual2012Photos/index.html | - |
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