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Study on the Relation Between Local Variance and Image Steganography in Frequency Domain
- Authors
- Lee, Jae Hoon; Lee, Sang Hwa; PARK, JONG IL
- Issue Date
- Jul-2017
- Publisher
- The Institute of Electronics and Information Engineers (IEIE)
- Citation
- Proceedings of the 32nd International Technical Conference on Circuits, Systems, Computers, and Communications (ITC-CSCC’17), pp.158 - 161
- Conference Name
- Proceedings of the 32nd International Technical Conference on Circuits, Systems, Computers, and Communications (ITC-CSCC’17)
- Place
- KO
Busan, Korea
- Conference Date
- 2017-07-02
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Collections - 서울 공과대학 > 서울 컴퓨터소프트웨어학부 > 2. Conference Papers
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Related Researcher
- Park, Jong-Il
- COLLEGE OF ENGINEERING (SCHOOL OF COMPUTER SCIENCE)