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Directed Model Checking for Fast Abstract Reachability Analysis

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dc.contributor.authorLee, Nakwon-
dc.contributor.authorKim, Yunho-
dc.contributor.authorKim, Moonzoo-
dc.contributor.authorRyu, Duksan-
dc.contributor.authorBaik, Jongmoon-
dc.date.accessioned2022-07-06T02:22:14Z-
dc.date.available2022-07-06T02:22:14Z-
dc.date.created2022-01-05-
dc.date.issued2021-12-
dc.identifier.issn2169-3536-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/138593-
dc.description.abstractWe propose a novel technique (TOUR) to improve both bug detection ability and verification speed of ARMC by detecting a target path quickly. The key idea of TOUR is an error location directed search that utilizes the distance to an error location and function call context at runtime. TOUR applies four different distance metrics and a distance metric selection heuristic using static features of a target program. We have extensively evaluated TOUR on 3,042 real-world C programs in a software verification competition benchmark. The experiment results show that TOUR, due to its error location directed search, finds bugs in 20% more programs in 11% less model checking time than the state-of-the-art ARMC technique (i.e., block-abstraction memoization) for 354 buggy programs. Also, TOUR verifies 15% more programs within 15% less model checking time than the block-abstraction memoization for 652 complex clean programs.-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleDirected Model Checking for Fast Abstract Reachability Analysis-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Yunho-
dc.identifier.doi10.1109/ACCESS.2021.3130569-
dc.identifier.scopusid2-s2.0-85120579116-
dc.identifier.wosid000728133400001-
dc.identifier.bibliographicCitationIEEE ACCESS, v.9, pp.158738 - 158750-
dc.relation.isPartOfIEEE ACCESS-
dc.citation.titleIEEE ACCESS-
dc.citation.volume9-
dc.citation.startPage158738-
dc.citation.endPage158750-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessY-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaTelecommunications-
dc.relation.journalWebOfScienceCategoryComputer Science, Information Systems-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryTelecommunications-
dc.subject.keywordPlusAbstracting-
dc.subject.keywordPlusC (programming language)-
dc.subject.keywordPlusErrors-
dc.subject.keywordPlusHeuristic algorithms-
dc.subject.keywordPlusLocation-
dc.subject.keywordPlusModel checking-
dc.subject.keywordPlusProgram debugging-
dc.subject.keywordPlusAbstract reachability-
dc.subject.keywordPlusAnnotation-
dc.subject.keywordPlusComputer bugs-
dc.subject.keywordPlusDirected searches-
dc.subject.keywordPlusInterprocedural Analysis-
dc.subject.keywordPlusModels checking-
dc.subject.keywordPlusReachability-
dc.subject.keywordPlusReachability analysis-
dc.subject.keywordPlusRuntimes-
dc.subject.keywordPlusSoftware-
dc.subject.keywordPlusSoftware testings-
dc.subject.keywordPlusSoftware verification-
dc.subject.keywordPlusSymbolic model checking-
dc.subject.keywordPlusSoftware testing-
dc.subject.keywordAuthorMeasurement-
dc.subject.keywordAuthorRuntime-
dc.subject.keywordAuthorModel checking-
dc.subject.keywordAuthorComputer bugs-
dc.subject.keywordAuthorAnnotations-
dc.subject.keywordAuthorSoftware-
dc.subject.keywordAuthorReachability analysis-
dc.subject.keywordAuthorSoftware verification-
dc.subject.keywordAuthorsoftware testing-
dc.subject.keywordAuthorsymbolic model checking-
dc.subject.keywordAuthorabstract reachability-
dc.subject.keywordAuthorinterprocedural analysis-
dc.subject.keywordAuthordirected search-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/9627119-
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