Nano-Thermal Analysis of Defect-Induced Surface Pre-Melting in 2D Telluriumopen access
- Authors
- Park, Dae Young; Yu, Hyang Mi; Jeong, Byeong Geun; An, Sung-Jin; Kim, Sung Hyuk; Jeong, Mun Seok
- Issue Date
- Oct-2021
- Publisher
- MDPI
- Keywords
- 2D Tellurium; nano thermal analysis (Nano TA); surface pre-melting
- Citation
- NANOMATERIALS, v.11, no.10, pp.1 - 9
- Indexed
- SCIE
SCOPUS
- Journal Title
- NANOMATERIALS
- Volume
- 11
- Number
- 10
- Start Page
- 1
- End Page
- 9
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/140829
- DOI
- 10.3390/nano11102735
- ISSN
- 2079-4991
- Abstract
- Thermal properties, such as thermal conductivity, heat capacity, and melting temperature, influence the efficiency and stability of two-dimensional (2D) material applications. However, existing studies on thermal characteristics-except for thermal conductivity-are insufficient for 2D materials. Here, we investigated the melting temperature of 2D Tellurium (2D Te) using the nano-thermal analysis technique and found anomalous behavior that occurs before the melting temperature is reached. The theoretical calculations present surface pre-melting in 2D Te and Raman scattering measurements suggest that defects in 2D Te accelerate surface pre-melting. Understanding the pre-melting surface characteristics of 2D Te will provide valuable information for practical applications.
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