Detailed Information

Cited 2 time in webofscience Cited 3 time in scopus
Metadata Downloads

Perfectly Matched Layer Formulation of the INBC-FDTD Algorithm for Electromagnetic Analysis of Thin Film Materials

Full metadata record
DC Field Value Language
dc.contributor.authorJang, Sangeun-
dc.contributor.authorJung, Kyung-Young-
dc.date.accessioned2022-07-06T16:01:57Z-
dc.date.available2022-07-06T16:01:57Z-
dc.date.created2021-11-22-
dc.date.issued2021-08-
dc.identifier.issn2169-3536-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/141390-
dc.description.abstractThe impedance network boundary condition (INBC)-based finite-difference time-domain (FDTD) method has been widely used for electromagnetic analysis of highly conductive thin film materials. In the INBC-FDTD formulation, the electromagnetic field variations inside the thin film material are taken into account mathematically and thus extremely small FDTD grids are not necessary for the FDTD modeling of the material. Therefore, computational efficiency of the INBC-FDTD formulation is significantly better than other FDTD formulations. Albeit with this great advantage, the INBC-FDTD formulation cannot be fully employed for thin film materials because the corresponding perfectly matched layer (PML) formulation has not been reported in literature. In this work, we propose a PML formulation suitable for the INBC-FDTD algorithm. Numerical examples illustrate that the proposed PML-INBC-FDTD formulation can yield good absorption performance and also it can improve computational efficiency while maintaining numerical accuracy.-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titlePerfectly Matched Layer Formulation of the INBC-FDTD Algorithm for Electromagnetic Analysis of Thin Film Materials-
dc.typeArticle-
dc.contributor.affiliatedAuthorJung, Kyung-Young-
dc.identifier.doi10.1109/ACCESS.2021.3107528-
dc.identifier.scopusid2-s2.0-85113892653-
dc.identifier.wosid000692175100001-
dc.identifier.bibliographicCitationIEEE ACCESS, v.9, pp.118099 - 118106-
dc.relation.isPartOfIEEE ACCESS-
dc.citation.titleIEEE ACCESS-
dc.citation.volume9-
dc.citation.startPage118099-
dc.citation.endPage118106-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessY-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaTelecommunications-
dc.relation.journalWebOfScienceCategoryComputer Science, Information Systems-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryTelecommunications-
dc.subject.keywordPlusTIME-DOMAIN METHOD-
dc.subject.keywordPlusSHIELDING EFFECTIVENESS-
dc.subject.keywordPlusCFS-PML-
dc.subject.keywordPlusGRAPHENE-
dc.subject.keywordPlusIMPLEMENTATION-
dc.subject.keywordPlusMODEL-
dc.subject.keywordAuthorFinite difference methods-
dc.subject.keywordAuthorTime-domain analysis-
dc.subject.keywordAuthorImpedance-
dc.subject.keywordAuthorBoundary conditions-
dc.subject.keywordAuthorSurface impedance-
dc.subject.keywordAuthorPerfectly matched layers-
dc.subject.keywordAuthorMedia-
dc.subject.keywordAuthorFinite-difference time-domain (FDTD) method-
dc.subject.keywordAuthorimpedance network boundary condition-
dc.subject.keywordAuthorperfectly matched layer-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/9521781-
Files in This Item
Appears in
Collections
서울 공과대학 > 서울 융합전자공학부 > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Jung, Kyung Young photo

Jung, Kyung Young
COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE