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Iterative Pseudo-Soft-Reliability-based Majority-Logic Decoding for NAND Flash Memory

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dc.contributor.authorPark, KB-
dc.contributor.authorChung, K-
dc.date.accessioned2022-07-06T18:20:31Z-
dc.date.available2022-07-06T18:20:31Z-
dc.date.created2021-07-14-
dc.date.issued2021-05-
dc.identifier.issn2169-3536-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/141929-
dc.description.abstractThis paper proposes a decoding algorithm for nonbinary low-density parity-check (NB-LDPC) codes, aiming to improve the error rate performance for NAND flash memory. Several NB-LDPC decoding methods for NAND flash memory have been studied. Some approaches rely on hard decisions, and these are relatively simple but do not have a good error rate performance. Others are based on soft decisions that require multiple reads for each flash memory cell, leading to significant memory throughput degradation. To improve the error rate performance without suffering performance degradation owing to multiple reads, an iterative pseudo-soft-reliability-based decoding algorithm is proposed. Using Galois field addition to calculate the Hamming distance at the initialization, the proposed algorithm not only improves the error rate performance but also reduces the average number of iterations compared with those of conventional hard-decision-based decoding algorithms. CCBY-
dc.language영어-
dc.language.isoen-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleIterative Pseudo-Soft-Reliability-based Majority-Logic Decoding for NAND Flash Memory-
dc.typeArticle-
dc.contributor.affiliatedAuthorChung, K-
dc.identifier.doi10.1109/ACCESS.2021.3079939-
dc.identifier.scopusid2-s2.0-85105879825-
dc.identifier.wosid000673584600001-
dc.identifier.bibliographicCitationIEEE Access, v.9, pp.74531 - 74538-
dc.relation.isPartOfIEEE Access-
dc.citation.titleIEEE Access-
dc.citation.volume9-
dc.citation.startPage74531-
dc.citation.endPage74538-
dc.type.rimsART-
dc.type.docTypeArticle in Press-
dc.description.journalClass1-
dc.description.isOpenAccessY-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaTelecommunications-
dc.relation.journalWebOfScienceCategoryComputer Science, Information Systems-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryTelecommunications-
dc.subject.keywordPlusErrors-
dc.subject.keywordPlusFlash memory-
dc.subject.keywordPlusHamming distance-
dc.subject.keywordPlusMajority logic-
dc.subject.keywordPlusMemory architecture-
dc.subject.keywordPlusNAND circuits-
dc.subject.keywordPlusTurbo codes-
dc.subject.keywordPlusDecoding algorithm-
dc.subject.keywordPlusError rate performance-
dc.subject.keywordPlusFlash memory cell-
dc.subject.keywordPlusLow density parity check-
dc.subject.keywordPlusMajority logic decoding-
dc.subject.keywordPlusNAND flash memory-
dc.subject.keywordPlusPerformance degradation-
dc.subject.keywordPlusThroughput degradation-
dc.subject.keywordPlusIterative decoding-
dc.subject.keywordAuthorComplexity theory-
dc.subject.keywordAuthorDecoding-
dc.subject.keywordAuthorError analysis-
dc.subject.keywordAuthorError correction codes-
dc.subject.keywordAuthorHamming distance-
dc.subject.keywordAuthorHamming distance-
dc.subject.keywordAuthorHard decision-
dc.subject.keywordAuthorIterative decoding-
dc.subject.keywordAuthorIterative hard-reliability-based majority-logic decoding algorithm-
dc.subject.keywordAuthorNAND flash memory-
dc.subject.keywordAuthorNonbinary low-density parity-check codes-
dc.subject.keywordAuthorPrediction algorithms-
dc.subject.keywordAuthorReliability-
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