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Process-Portable and Programmable Layout Generation of Digital Circuits in Advanced DRAM Technologies
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Yoon, Youngbog | - |
| dc.contributor.author | Han, Daeyong | - |
| dc.contributor.author | Chu, Shinho | - |
| dc.contributor.author | Lee, Sangho | - |
| dc.contributor.author | Han, Jae duk | - |
| dc.contributor.author | Chun, Junhyun | - |
| dc.date.accessioned | 2022-07-07T00:55:47Z | - |
| dc.date.available | 2022-07-07T00:55:47Z | - |
| dc.date.created | 2021-05-14 | - |
| dc.date.issued | 2021-02 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/142319 | - |
| dc.description.abstract | This paper introduces a physical layout design methodology that produces DRC-clean, area-efficient, and programmable layouts of digital circuits in advanced DRAM processes. The proposed methodology automates the layout generation process to enhance design productivity, while still providing rich customization for efficient area and routing resource utilizations. Process-specific parameterized cells (PCells) are combined with process-independent place-and-route functions to automatically generate area-efficient and programmable layouts. Routing grids are optimized to enhance the area and routing efficiency. The proposed method reduced the design time of digital layouts by 80% compared to a manual design with high layout qualities, significantly enhancing the design productivity. | - |
| dc.language | 영어 | - |
| dc.language.iso | en | - |
| dc.publisher | IEEE | - |
| dc.title | Process-Portable and Programmable Layout Generation of Digital Circuits in Advanced DRAM Technologies | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Han, Jae duk | - |
| dc.identifier.doi | 10.23919/DATE51398.2021.9474014 | - |
| dc.identifier.bibliographicCitation | 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), pp.721 - 722 | - |
| dc.relation.isPartOf | 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) | - |
| dc.citation.title | 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) | - |
| dc.citation.startPage | 721 | - |
| dc.citation.endPage | 722 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Proceeding | - |
| dc.description.journalClass | 3 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | other | - |
| dc.subject.keywordAuthor | DRAM | - |
| dc.subject.keywordAuthor | Standard cells | - |
| dc.subject.keywordAuthor | Layout | - |
| dc.subject.keywordAuthor | Design automation | - |
| dc.subject.keywordAuthor | Templates | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/9474014 | - |
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