Probe diagnostics in the far scrape-off layer plasma of Korea Superconducting Tokamak Advanced Research tokamak using a sideband harmonic method
DC Field | Value | Language |
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dc.contributor.author | Kim, Dong-Hwan | - |
dc.contributor.author | Hong, Suk-Ho | - |
dc.contributor.author | Park, Il-Seo | - |
dc.contributor.author | Lee, Hyo-Chang | - |
dc.contributor.author | Kang, Hyun-Ju | - |
dc.contributor.author | Chung, Chin-Wook | - |
dc.date.accessioned | 2022-07-07T04:27:20Z | - |
dc.date.available | 2022-07-07T04:27:20Z | - |
dc.date.created | 2021-05-12 | - |
dc.date.issued | 2015-12 | - |
dc.identifier.issn | 0034-6748 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/143055 | - |
dc.description.abstract | Plasma characteristics in the far scrape-off layer region of tokamak play a crucial role in the stable plasma operation and its sustainability. Due to the huge facility, electrical diagnostic systems to measure plasma properties have extremely long cable length resulting in large stray current. To overcome this problem, a sideband harmonic method was applied to the Korea Superconducting Tokamak Advanced Research tokamak plasma. The sideband method allows the measurement of the electron temperature and the plasma density without the effect of the stray current. The measured plasma densities are compared with those from the interferometer, and the results show reliability of the method. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | AMER INST PHYSICS | - |
dc.title | Probe diagnostics in the far scrape-off layer plasma of Korea Superconducting Tokamak Advanced Research tokamak using a sideband harmonic method | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Chung, Chin-Wook | - |
dc.identifier.doi | 10.1063/1.4937610 | - |
dc.identifier.scopusid | 2-s2.0-84951325945 | - |
dc.identifier.wosid | 000368594900030 | - |
dc.identifier.bibliographicCitation | REVIEW OF SCIENTIFIC INSTRUMENTS, v.86, no.12, pp.1 - 5 | - |
dc.relation.isPartOf | REVIEW OF SCIENTIFIC INSTRUMENTS | - |
dc.citation.title | REVIEW OF SCIENTIFIC INSTRUMENTS | - |
dc.citation.volume | 86 | - |
dc.citation.number | 12 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 5 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | ELECTRON-TEMPERATURE | - |
dc.subject.keywordPlus | DIII-D | - |
dc.subject.keywordPlus | FLUCTUATIONS | - |
dc.subject.keywordPlus | TRANSPORT | - |
dc.identifier.url | https://aip.scitation.org/doi/10.1063/1.4937610 | - |
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