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Correlation between Pd metal thickness and thermally stable perpendicular magnetic anisotropy features in [Co/Pd](n) multilayers at annealing temperatures up to 500 degrees C
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | An, Gwang Guk | - |
| dc.contributor.author | Lee, Ja Bin | - |
| dc.contributor.author | Yang, Seung Mo | - |
| dc.contributor.author | Kim, Jae Hong | - |
| dc.contributor.author | Chung, Woo Seong | - |
| dc.contributor.author | Yoon, Kap Soo | - |
| dc.contributor.author | Hong, Jin Pyo | - |
| dc.date.accessioned | 2022-07-07T04:53:03Z | - |
| dc.date.available | 2022-07-07T04:53:03Z | - |
| dc.date.issued | 2015-02 | - |
| dc.identifier.issn | 2158-3226 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/143255 | - |
| dc.description.abstract | We examine highly stable perpendicular magnetic anisotropy (PMA) features of [Co/Pd](10) multilayers (MLs) versus Pd thickness at various ex-situ annealing temperatures. Thermally stable PMA characteristics were observed up to 500 degrees C, confirming the suitability of these systems for industrial applications at this temperature. Experimental observations suggest that the choice of equivalent Co and Pd layer thicknesses in a ML configuration ensures thermally stable PMA features, even at higher annealing temperatures. X-ray diffraction patterns and cross-sectional transmission electron microscopy images were obtained to determine thickness, post-annealing PMA behavior, and to explore the structural features that govern these findings. | - |
| dc.format.extent | 7 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | American Institute of Physics Inc. | - |
| dc.title | Correlation between Pd metal thickness and thermally stable perpendicular magnetic anisotropy features in [Co/Pd](n) multilayers at annealing temperatures up to 500 degrees C | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1063/1.4913997 | - |
| dc.identifier.scopusid | 2-s2.0-84924035295 | - |
| dc.identifier.wosid | 000350545500037 | - |
| dc.identifier.bibliographicCitation | AIP Advances, v.5, no.2, pp 1 - 7 | - |
| dc.citation.title | AIP Advances | - |
| dc.citation.volume | 5 | - |
| dc.citation.number | 2 | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 7 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | TRANSFER TORQUE RAM | - |
| dc.subject.keywordPlus | SPIN | - |
| dc.subject.keywordPlus | ELECTRODES | - |
| dc.subject.keywordPlus | DICHROISM | - |
| dc.subject.keywordPlus | SPRAM | - |
| dc.subject.keywordPlus | FILMS | - |
| dc.subject.keywordPlus | WRITE | - |
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