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Enhanced Plasma Uniformity in RF Plasma With Side Multihole

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dc.contributor.authorLee, Hyo-Chang-
dc.contributor.authorChung, Chin-Wook-
dc.date.accessioned2022-07-07T13:28:59Z-
dc.date.available2022-07-07T13:28:59Z-
dc.date.created2021-05-12-
dc.date.issued2014-10-
dc.identifier.issn0093-3813-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/144499-
dc.description.abstractCapacitively coupled plasma source with side multihole is studied. Due to the hollow cathode effect at the multihole, edge plasma density is strongly increased and thus, plasma uniformity is significantly enhanced.-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleEnhanced Plasma Uniformity in RF Plasma With Side Multihole-
dc.typeArticle-
dc.contributor.affiliatedAuthorChung, Chin-Wook-
dc.identifier.doi10.1109/TPS.2014.2331680-
dc.identifier.scopusid2-s2.0-84908416002-
dc.identifier.wosid000344548300221-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON PLASMA SCIENCE, v.42, no.10, pp.2766 - 2767-
dc.relation.isPartOfIEEE TRANSACTIONS ON PLASMA SCIENCE-
dc.citation.titleIEEE TRANSACTIONS ON PLASMA SCIENCE-
dc.citation.volume42-
dc.citation.number10-
dc.citation.startPage2766-
dc.citation.endPage2767-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Fluids & Plasmas-
dc.subject.keywordPlusDISCHARGES-
dc.subject.keywordAuthorCapacitively coupled plasma (CCP)-
dc.subject.keywordAuthorhollow cathode-
dc.subject.keywordAuthorplasma uniformity-
dc.subject.keywordAuthorradio-frequency (RF) gas discharge-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/6850019-
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