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Measurement of cos 2 beta in B-0 -> D((*))h(0) with D -> K-S(0)pi(+) pi(-) decays by a combined time-dependent Dalitz plot analysis of BABAR and Belle dataopen accessMeasurement of cos 2β in B0 → D()h0 with D → K0Sπ + π − decays by a combined time-dependent Dalitz plot analysis of BABAR and Belle data Measurement of cos2β in B0 →d (∗)h0 with D → KS0 π+π- decays by a combined time-dependent Dalitz plot analysis of B a B ar and Belle data
- Other Titles
- Measurement of cos 2β in B0 → D()h0 with D → K0Sπ + π − decays by a combined time-dependent Dalitz plot analysis of BABAR and Belle data Measurement of cos2β in B0 →d (∗)h0 with D → KS0 π+π- decays by a combined time-dependent Dalitz plot analysis of B a B ar and Belle data
- Authors
- Adachi, I.; Adye, T.; Ahmed, H.; Ahn, J. K.; Aihara, H.; Akar, S.; Alam, M. S.; Albert, J.; Anulli, F.; Arnaud, N.; Asner, D. M.; Aston, D.; Atmacan, H.; Aushev, T.; Ayad, R.; Badhrees, I.; Bakich, A. M.; Banerjee, Sw.; Bansal, V.; Barlow, R. J.; Batignani, G.; Beaulieu, A.; Behera, P.; Bellis, M.; Ben-Haim, E.; Bernard, D.; Bernlochner, F. U.; Bettarini, S.; Bettoni, D.; Bevan, A. J.; Bhardwaj, V.; Bhuyan, B.; Bianchi, F.; Biasini, M.; Biswal, J.; Blinov, V. E.; Bomben, M.; Bondar, A.; Bonneaud, G. R.; Bozek, A.; Bozzi, C.; Bracko, M.; Browder, T. E.; Brown, D. N.; Buenger, C.; Burchat, P. R.; Buzykaev, A. R.; Calabrese, R.; Calcaterra, A.; Calderini, G.; Di Carlo, S.; Carpinelli, M.; Cartaro, C.; Casarosa, G.; Cenci, R.; Chao, D. S.; Chauveau, J.; Cheaib, R.; Chen, A.; Chen, C.; Cheng, C. H.; Cheon, Byung Gu; Chilikin, K.; Cho, K.; Choi, Y.; Choudhury, S.; Chrzaszcz, M.; Cibinetto, G.; Cinabro, D.; Cochran, J.; Coleman, J. P.; Convery, M. R.; Cowan, G.; Cowan, R.; Cremaldi, L.; Cunliffe, S.; Dash, N.; Davier, M.; Davis, C. L.; De Mori, F.; De Nardo, G.; Denig, A. G.; de Sangro, R.; Dey, B.; Di Lodovico, F.; Dittrich, S.; Dolezal, Z.; Dorfan, J.; Drasal, Z.; Druzhinin, V. P.; Dunwoodie, W.; Ebert, M.; Echenard, B.; Eidelman, S.; Eigen, G.; Eisner, A. M.; Emery, S.; Epifanov, D.; Ernst, J. A.; Faccini, R.; Fast, J. E.; Feindt, M.; Ferrarotto, F.; Ferroni, F.; Field, R. C.; Filippi, A.; Finocchiaro, G.; Fioravanti, E.; Flood, K. T.; Forti, F.; Fritsch, M.; Fulsom, B. G.; Gabathuler, E.; Gamba, D.; Garg, R.; Garmash, A.; Gary, J. W.; Garzia, I.; Gaur, V.; Gaz, A.; Gelb, M.; Gershon, T. J.; Gioi, L. Li; Giorgi, M. A.; Giri, A.; Godang, R.; Goldenzweig, P.; Golob, B.; Golubev, V. B.; Gorodeisky, R.; Gradl, W.; Graham, M. T.; Grauges, E.; Griessinger, K.; Gritsan, A. V.; Gruenberg, O.; Guido, E.; Guttman, N.; Hafner, A.; Hara, T.; Harrison, P. F.; Hast, C.; Hayasaka, K.; Hearty, C.; Heck, M.; Hedges, M. T.; Hess, M.; Hirose, S.; Hitlin, D. G.; Honscheid, K.; Hou, W. -S.; Huard, Z.; Van Hulse, C.; Hutchcroft, D. E.; Inami, K.; Inguglia, G.; Innes, W. R.; Ishikawa, A.; Itoh, R.; Iwasaki, M.; Iwasaki, Y.; Izen, J. M.; Jacobs, W. W.; Jawahery, A.; Jessop, C. P.; Jia, S.; Jin, Y.; Joo, K. K.; Julius, T.; Kaliyar, A. B.; Kang, K. H.; Karyan, G.; Kass, R.; Kichimi, H.; Kim, D. Y.; Kim, J. B.; Kim, K. T.; Kim, S. H.; Kim, J.; Kim, P.; King, G. J.; Kinoshita, K.; Koch, H.; Kodys, P.; Kolomensky, Yu. G.; Korpar, S.; Kotchetkov, D.; Kowalewski, R.; Kravchenko, E. A.; Krizan, P.; Kroeger, R.; Krokovny, P.; Kuhr, T.; Kulasiri, R.; Kuzmin, A.; Kwon, Y. -J.; Lacker, H. M.; Lafferty, G. D.; Lanceri, L.; Lange, J. S.; Lange, D. J.; Lankford, A. J.; Latham, T. E.; Leddig, T.; Le Diberder, F.; Lee, I. S.; Lee, S. C.; Lees, J. P.; Leith, D. W. G. S.; Li, L. K.; Li, Y. B.; Li, Y.; Libby, J.; Liventsev, D.; Lockman, W. S.; Long, O.; LoSecco, J. M.; Lou, X. C.; Lubej, M.; Lueck, T.; Luitz, S.; Luo, T.; Luppi, E.; Lusiani, A.; Lutz, A. M.; MacFarlane, D. B.; MacNaughton, J.; Mallik, U.; Manoni, E.; Marchiori, G.; Margoni, M.; Martellotti, S.; Martinez-Vidal, F.; Masuda, M.; Matsuda, T.; Mattison, T. S.; Matvienko, D.; McKenna, J. A.; Meadows, B. T.; Merola, M.; Miyabayashi, K.; Miyashita, T. S.; Miyata, H.; Mizuk, R.; Mohanty, G. B.; Mori, T.; Muller, D. R.; Mueller, T.; Mussa, R.; Nakano, E.; Nakao, M.; Nanut, T.; Nath, K. J.; Nayak, M.; Neal, H.; Neri, N.; Nisar, N. K.; Nishida, S.; Nugent, I. M.; Oberhof, B.; Ocariz, J.; Ogawa, S.; Ongmongkolkul, P.; Ono, H.; Onuchin, A. P.; Oyanguren, A.; Pakhlov, P.; Pakhlova, G.; Pal, B.; Palano, A.; Palombo, F.; Vazquez, W. Panduro; Paoloni, E.; Pardi, S.; Park, H.; Passaggio, S.; Patrignani, C.; Patteri, P.; Paul, S.; Pavelkin, I.; Payne, D. J.; Pedlar, T. K.; Peimer, D. R.; Peruzzi, I. M.; Piccolo, M.; Piilonen, L. E.; Pilloni, A.; Piredda, G.; Poireau, V.; Porter, F. C.; Posocco, M.; Prell, S.; Prepost, R.; Puccio, E. M. T.; Purohit, M. V.; Pushpawela, B. G.; Rama, M.; Randle-Conde, A.; Ratcliff, B. N.; Raven, G.; Resmi, P. K.; Ritchie, J. L.; Ritter, M.; Rizzo, G.; Roberts, D. A.; Robertson, S. H.; Roehrken, M.; Roney, J. M.; Roodman, A.; Rossi, A.; Rotondo, M.; Rozanska, M.; Russo, G.; Sacco, R.; Al Said, S.; Sakai, Y.; Sandilya, S.; Santelj, L.; Santoro, V.; Sanuki, T.; Savinov, V.; Schneider, O.; Schnell, G.; Schroeder, T.; Schubert, K. R.; Schwanda, C.; Schwartz, A. J.; Schwitters, R. F.; Sciacca, C.; Seddon, R. M.; Seino, Y.; Sekula, S. J.; Senyo, K.; Seon, O.; Serednyakov, S. I.; Sevior, M. E.; Shebalin, V.; Shibata, T. -A.; Shimizu, N.; Shiu, J. -G.; Simi, G.; Simon, F.; Simonetto, F.; Skovpen, Yu. I.; Smith, J. G.; Smith, A. J. S.; So, R. Y.; Sobie, R. J.; Soffer, A.; Sokoloff, M. D.; Solodov, E. P.; Solovieva, E.; Spanier, S. M.; Staric, M.; Stroili, R.; Sullivan, M. K.; Sumisawa, K.; Sumiyoshi, T.; Summers, D. J.; Sun, L.; Takizawa, M.; Tamponi, U.; Tanida, K.; Taras, P.; Tasneem, N.; Tenchini, F.; Tisserand, V.; Todyshevx, K. Yu.; Touramanis, C.; Uchida, M.; Uglov, T.; Unno, Y.; Uno, S.; Vahsen, S. E.; Varner, G.; Vasseur, G.; Va'vra, J.; Cervenkov, D.; Verderi, M.; Vitale, L.; Vorobyev, V.; Voss, C.; Wagner, S. R.; Waheed, E.; Waldi, R.; Walsh, J. J.; Wang, B.; Wang, C. H.; Wang, M. -Z.; Wang, P.; Wilson, F. F.; Wilson, J. R.; Wisniewski, W. J.; Won, E.; Wormser, G.; Wright, D. M.; Wu, S. L.; Yuan, C. Z.; Yusa, Y.; Zakharov, S.; Zallo, A.; Zani, L.; Zhang, Z. P.; Zhilich, V.; Zhukova, V.; Zhulanov, V.; Zupanc, A.
- Issue Date
- Dec-2018
- Publisher
- AMER PHYSICAL SOC
- Citation
- PHYSICAL REVIEW D, v.98, no.11, pp.1 - 29
- Indexed
- SCIE
SCOPUS
- Journal Title
- PHYSICAL REVIEW D
- Volume
- 98
- Number
- 11
- Start Page
- 1
- End Page
- 29
- ISSN
- 2470-0010
- Abstract
- We report measurements of sin 2 beta and cos 2 beta using a time-dependent Dalitz plot analysis of B-0 -> D((*))h(0) with D -> K-S(0)pi(+)pi(-) decays, where the light unflavored and neutral hadron h(0) is a pi(0),eta, or omega meson. The analysis uses a combination of the final data sets of the BABAR and Belle experiments containing 471 x 10(6) and 772 x 10(6) B (B) over bar pairs collected at the gamma(4S) resonance at the asymmetric-energy B factories PEP-II at SLAC and KEKB at KEK, respectively. We measure sin 2 beta = 0.80 +/- 0.14(stat) +/- 0.06(syst) +/- 0.03(model) and cos 2 beta = 0.91 +/- 0.22(stat) +/- 0.09(syst) +/- 0.07(model). The result for the direct measurement of the angle is beta = (22.5 +/- 4.4(stat) +/- 1.2(syst) +/- 0.6(model))degrees. The last quoted uncertainties are due to the composition of the D-0 -> K-S(0)pi(+)pi(-) decay amplitude model, which is newly established by a Dalitz plot amplitude analysis of a high-statistics e(+) e(-) -> c (c) over bar data sample as part of this analysis. We find the first evidence for cos 2 beta > 0 at the level of 3.7 standard deviations. The measurement excludes the trigonometric multifold solution pi/2 - beta = (68.1 +/- 0.7)degrees at the level of 7.3 standard deviations and therefore resolves an ambiguity in the determination of the apex of the CKM Unitarity Triangle. The hypothesis of beta = 0 degrees is ruled out at the level of 5.1 standard deviations, and thus CP violation is observed in B-0 -> D-(*) h(0) decays. The measurement assumes no direct CP violation in B-0 -> D-(*) h(0) decays.
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Related Researcher
- Cheon, Byung Gu
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF PHYSICS)