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Performance analysis and improvement of JPV primality test for smart IC cards
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Jo, Ho sung
;
Park, Hee jin
Article
Issue Date
2014
Citation
2014 International Conference on Big Data and Smart Computing, BIGCOMP 2014, pp.271 - 275
Publisher
IEEE
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Park, Hee jin
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Jo, Ho sung
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Algorithms
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Performance analysis and improvem...
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Primality test
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Primality tests
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Prime generation
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Prime generation algorithms
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Probabilistic analysis
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Public key cryptography
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