Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Performance analysis and improvement of JPV primality test for smart IC cards
- Authors
- Jo, Ho sung; Park, Hee jin
- Issue Date
- Feb-2014
- Publisher
- IEEE
- Keywords
- Primality test; Prime generation; Public-key cryptosystem
- Citation
- 2014 International Conference on Big Data and Smart Computing, BIGCOMP 2014, pp.271 - 275
- Indexed
- SCOPUS
- Journal Title
- 2014 International Conference on Big Data and Smart Computing, BIGCOMP 2014
- Start Page
- 271
- End Page
- 275
- Abstract
- JPV algorithm, proposed by Joye et al. was predicted to be faster than the combined prime generation algorithm but it runs slower in practice. This discrepancy is because only the number of Fermat test calls was compared in estimating a total running time. We present a probabilistic analysis on the total running time of JPV algorithm. This analysis is very accurate and corresponds to the experiment with only 1-2% error. Furthermore, we propose an improved JPV algorithm that uses Euclid function. It is faster than JPV algorithm and similar to the combined algorithm with the same space requirement.
- Files in This Item
- Go to Link
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Jo, Ho sung
- COLLEGE OF ENGINEERING (INNOVATION CENTER FOR ENGINEERING EDUCATION)