Characteristics of Virtual Reflection Images in Seismic Interferometry Using Synthetic Seismic Dataopen access합성탄성파자료를 이용한 지진파 간섭법의 가상반사파 영상 특성
- Other Titles
- 합성탄성파자료를 이용한 지진파 간섭법의 가상반사파 영상 특성
- Authors
- Kim, Ki Young; Park, Iseul; Byun, Joong moo
- Issue Date
- May-2018
- Publisher
- KOREAN SOC EARTH & EXPLORATION GEOPHYSICISTS
- Keywords
- seismic interferometry; virtual reflection image; synthetic seismic data; stretch mute; processing noise
- Citation
- GEOPHYSICS AND GEOPHYSICAL EXPLORATION, v.21, no.2, pp.94 - 102
- Indexed
- KCI
- Journal Title
- GEOPHYSICS AND GEOPHYSICAL EXPLORATION
- Volume
- 21
- Number
- 2
- Start Page
- 94
- End Page
- 102
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/150111
- DOI
- 10.7582/GGE.2018.21.2.094
- ISSN
- 1229-1064
- Abstract
- To characterize virtual reflection images of deep subsurface by the method of seismic interferometry, we analyzed effects of offset range, ambient noise, missing data, and statics on interferograms. For the analyses, seismic energy was simulated to be generated by a 5 Hz point source at the surface. Vertical components of particle velocity were computed at 201 sensor locations at 100 m depths of 1 km intervals by the finite difference method. Each pair of synthetic seismic traces was cross-correlated to generate stacked reflection section by the conventional processing method. Wide-angle reflection problems in reflection interferometry can be minimized by setting a maximum offset range. Ambient noise, missing data, and statics turn to yield processing noise that spreads out from virtual sources due to stretch mutes during normal moveout corrections. The level of processing noise is most sensitive to amplitude and duration time of ambient noise in stacked sections but also affected by number of missing data and the amount of statics.
- Files in This Item
-
- Appears in
Collections - 서울 공과대학 > 서울 자원환경공학과 > 1. Journal Articles
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.