Solid State Drive(SSD)에 대한 가속열화시험 데이터 모델링 및 분석
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 문병민 | - |
dc.contributor.author | 최영진 | - |
dc.contributor.author | 지유민 | - |
dc.contributor.author | 이용중 | - |
dc.contributor.author | 이근우 | - |
dc.contributor.author | 나한주 | - |
dc.contributor.author | 양중섭 | - |
dc.contributor.author | 배석주 | - |
dc.date.accessioned | 2022-07-12T07:36:58Z | - |
dc.date.available | 2022-07-12T07:36:58Z | - |
dc.date.created | 2021-05-13 | - |
dc.date.issued | 2018-03 | - |
dc.identifier.issn | 1738-9895 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/150401 | - |
dc.description.abstract | Purpose: Accelerated degradation tests can be effective in assessing product reliability when degradation leading to failure can be observed. This article proposes an accelerated degradation test model for highly reliable solid state drives (SSDs). Methods: We suggest a nonlinear mixed-effects (NLME) model to degradation data for SSDs. A Monte Carlo simulation is used to estimate lifetime distribution in accelerated degradation testing data. This simulation is performed by generating random samples from the assumed NLME model. Conclusion: We apply the proposed method to degradation data collected from SSDs. The derived power model is shown to be much better at fitting the degradation data than other existing models. Finally, the Monte Carlo simulation based on the NLME model provides reasonable results in lifetime estimation. | - |
dc.language | 한국어 | - |
dc.language.iso | ko | - |
dc.publisher | 한국신뢰성학회 | - |
dc.title | Solid State Drive(SSD)에 대한 가속열화시험 데이터 모델링 및 분석 | - |
dc.title.alternative | Modeling and Analysis of Accelerated Degradation Testing Data for a Solid State Drive (SSD) | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | 배석주 | - |
dc.identifier.doi | 10.33162/JAR.2018.03.18.1.33 | - |
dc.identifier.bibliographicCitation | 신뢰성 응용연구, v.18, no.1, pp.33 - 39 | - |
dc.relation.isPartOf | 신뢰성 응용연구 | - |
dc.citation.title | 신뢰성 응용연구 | - |
dc.citation.volume | 18 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 33 | - |
dc.citation.endPage | 39 | - |
dc.type.rims | ART | - |
dc.identifier.kciid | ART002329054 | - |
dc.description.journalClass | 2 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | kci | - |
dc.subject.keywordAuthor | Accelerated Degradation Test | - |
dc.subject.keywordAuthor | Degradation Model | - |
dc.subject.keywordAuthor | Non-Linear Mixed-Effects Model | - |
dc.subject.keywordAuthor | Raw Bit Error Rate | - |
dc.subject.keywordAuthor | Solid State Drive | - |
dc.identifier.url | https://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE07408860&language=ko_KR&hasTopBanner=true | - |
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