Time-dependent mechanical-electrical coupled behavior in single crystal ZnO nanorodsopen access
- Authors
- Kim, Yong-Jae; Yun, Tae Gwang; Choi, In-Chul; Kim, Sungwoong; Park, Won Il; Han, Seung Min; Jang, Jae-il
- Issue Date
- May-2015
- Publisher
- NATURE RESEARCH
- Citation
- SCIENTIFIC REPORTS, v.5, pp.1 - 7
- Indexed
- SCIE
SCOPUS
- Journal Title
- SCIENTIFIC REPORTS
- Volume
- 5
- Start Page
- 1
- End Page
- 7
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/157351
- DOI
- 10.1038/srep09716
- ISSN
- 2045-2322
- Abstract
- Nanoscale time-dependent mechanical-electrical coupled behavior of single crystal ZnO nanorods was systematically explored, which is essential for accessing the long-term reliability of the ZnO nanorod-based flexible devices. A series of compression creep tests combined with in-situ electrical measurement was performed on vertically-grown single crystal ZnO nanorods. Continuous measurement of the current (I)-voltage (V) curves before, during, after the creep tests revealed that I is non-negligibly increased as a result of the time-dependent deformation. Analysis of the I-V curves based on the thermionic emission-diffusion theory allowed extraction of nanorod resistance, which was shown to decrease as time-dependent deformation. Finally, based on the observations in this study, a simple analytical model for predicting the reduction in nanorod resistance as a function of creep strain that is induced from diffusional mechanisms is proposed, and this model was demonstrated to be in an excellent agreement with the experimental results.
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