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Stochastic Model for SPICE simulation about Resistance Distribution of Magnetic Tunnel Junction

Authors
Kil, GyuhyunChoi, JuntaeChoi, ChulminSukegawa, HiroakiMitani, SeijiSong, Yun Heub
Issue Date
Sep-2014
Publisher
The Japan society of applied physics
Citation
Extended Abstracts of the 2014 International Conference on Solid State Devices and Materials, pp.86 - 87
Indexed
OTHER
Journal Title
Extended Abstracts of the 2014 International Conference on Solid State Devices and Materials
Start Page
86
End Page
87
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/159100
DOI
10.7567/SSDM.2014.PS-4-10
Abstract
A non-uniform resistance distribution for magnetic tunnel junction (MTJ) causes serious problem to realize for commercial Gbit STT-MRAM. The resistance of MTJ is varied by a combination of various causes referred to as a stochastic behavior. In this paper, we investigated a stochastic behavior model for MTJ resistance from measured real data. The proposed model can be possible to analyze an exact resistance behavior of MTJ at any parameter variation. It can be very useful for circuit design and simulation purposes.
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