Built-in hardware pseudo-random test module for physical unclonable functions
- Authors
- Lee, Jae Seong; Choi, Piljoo; Kim, Song-Ju; Choi, Byong-Deok; Kim, Dong Kyue
- Issue Date
- Apr-2014
- Publisher
- IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
- Keywords
- PUF; random number; FIPS 140-2; security
- Citation
- IEICE NONLINEAR THEORY AND ITS APPLICATIONS, v.2, no.3, pp.1101 - 1112
- Indexed
- OTHER
- Journal Title
- IEICE NONLINEAR THEORY AND ITS APPLICATIONS
- Volume
- 2
- Number
- 3
- Start Page
- 1101
- End Page
- 1112
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/160135
- DOI
- 10.1587/nolta.5.101
- ISSN
- 2185-4106
- Abstract
- PUFs, that self-generate random numbers, are used in identification or authen- tication applications for two reasons: cost and security. Since the randomness of PUFs in individual chips may differ, PUFs in some chips may generate somewhat less than random values. Defects during manufacturing may also affect the randomness of PUFs. In either case, confidential information based on PUF's could be vulnerable to security threats. Thus, it is nec- essary to identify both failing chips during manufacturing and PUFs which are not sufficiently random. To test the randomness of PUFs in a chip, we have designed a dedicated random test module optimized for hardware implementation. Finally, by implementing the module in real PUFs, we verified its validity.
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