ConferenceIssue Date2017Citation2017 American Control Conference, ACC 2017, pp.2998 - 3003PublisherInstitute of Electrical and Electronics Engineers Inc.PlaceUS; Seattle, WA, USA
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ConferenceIssue Date2018Citation2018 Annual American Control Conference, ACC 2018, pp.3239 - 3244PublisherInstitute of Electrical and Electronics Engineers Inc.PlaceUS; Wisconsin Center
ConferenceIssue Date2018Citation2018 Annual American Control Conference, ACC 2018, pp.4757 - 4763PublisherInstitute of Electrical and Electronics Engineers Inc.PlaceUS; Wisconsin Center
Choi, W.Y.; Kim, D.J.; Kang, C.M.; Lee, S.-H.; Chung, C.C.
ConferenceIssue Date2018Citation2018 Annual American Control Conference, ACC 2018, pp.4739 - 4744PublisherInstitute of Electrical and Electronics Engineers Inc.PlaceUS; Wisconsin Center
ConferenceIssue Date2017Citation2017 American Control Conference, ACC 2017, pp.2078 - 2084PublisherInstitute of Electrical and Electronics Engineers Inc.PlaceUS; Seattle, WA, USA