Electron density and electron temperature measurement in a bi-Maxwellian electron distribution using a derivative method of Langmuir probes
- Authors
- Choi, Ikjin; Chung, ChinWook; Moon, Se Youn
- Issue Date
- Aug-2013
- Publisher
- AMER INST PHYSICS
- Citation
- PHYSICS OF PLASMAS, v.20, no.8, pp.1 - 4
- Indexed
- SCIE
SCOPUS
- Journal Title
- PHYSICS OF PLASMAS
- Volume
- 20
- Number
- 8
- Start Page
- 1
- End Page
- 4
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/162260
- DOI
- 10.1063/1.4818609
- ISSN
- 1070-664X
- Abstract
- In plasma diagnostics with a single Langmuir probe, the electron temperature T-e is usually obtained from the slope of the logarithm of the electron current or from the electron energy probability functions of current (I)-voltage (V) curve. Recently, Chen [F. F. Chen, Phys. Plasmas 8, 3029 (2001)] suggested a derivative analysis method to obtain T-e by the ratio between the probe current and the derivative of the probe current at a plasma potential where the ion current becomes zero. Based on this method, electron temperatures and electron densities were measured and compared with those from the electron energy distribution function (EEDF) measurement in Maxwellian and bi-Maxwellian electron distribution conditions. In a bi-Maxwellian electron distribution, we found the electron temperature T-e obtained from the method is always lower than the effective temperatures T-eff derived from EEDFs. The theoretical analysis for this is presented.
- Files in This Item
-
Go to Link
- Appears in
Collections - 서울 공과대학 > 서울 전기공학전공 > 1. Journal Articles
![qrcode](https://api.qrserver.com/v1/create-qr-code/?size=55x55&data=https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/162260)
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.