Mechanical models for the analysis of bolted T-stub connections under cyclic loads
- Authors
- Hu, Jong Wan; Leon, Roberto T.; Park, Taehyo
- Issue Date
- Nov-2012
- Publisher
- ELSEVIER SCI LTD
- Keywords
- T-stub connection; Mechanical modeling; Stiffness property; Component spring; Joint element; Cyclic behavior
- Citation
- JOURNAL OF CONSTRUCTIONAL STEEL RESEARCH, v.78, pp.45 - 57
- Indexed
- SCIE
SCOPUS
- Journal Title
- JOURNAL OF CONSTRUCTIONAL STEEL RESEARCH
- Volume
- 78
- Start Page
- 45
- End Page
- 57
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/164285
- DOI
- 10.1016/j.jcsr.2012.05.011
- ISSN
- 0143-974X
- Abstract
- The mechanical models used to simulate the complete behavior of full-scale bolted T-stub connections under cyclic loads are mainly treated in this paper. These mechanical models are composed of individual T-stub components modeled as nonlinear spring elements in order to reliably reproduce their various response mechanisms interacting with one another in the connection. The hysteresis behaviors of the T-stub components including bolt/flange uplift, stem elongation, and relative slip deformation combined with bolt bearing are simulated by the multi-linear cyclic stiffness models characterized from their actual force-deformation response mechanisms each. The nonlinear component springs, which contain these idealized stiffness properties, are implemented into the user joint element produced based on the mechanical model so as to numerically generate the complete behavior of the full-scale connections with considerable accuracy. The analytical predictions performed on the joint element are evaluated against the experimental tests with respect to stiffness, strength, and deformation. Thus, the adequacy of the proposed modeling approach is verified through comparisons between analytical predictions and experimental test results. Finally, it can be shown that the mechanical model proposed in this study has the satisfactory potential to predict the response of the T-stub components as well as the behavior of the T-stub connections through analytical studies.
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