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Resistive switching effect for ZnO hybrid memory with metal-oxide nanocrystals

Authors
Lee, Dong UkKim, Eun KyuCho, Won-JuKim, Young-HoIm, Hyunsik
Issue Date
Oct-2012
Publisher
Elsevier Sequoia
Keywords
Nano-crystals; Hybrid; SnO2; Nonvolatile memory; Resistance random access memory; Polyimide
Citation
Thin Solid Films, v.521, pp 98 - 101
Pages
4
Indexed
SCI
SCIE
SCOPUS
Journal Title
Thin Solid Films
Volume
521
Start Page
98
End Page
101
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/164604
DOI
10.1016/j.tsf.2012.02.044
ISSN
0040-6090
Abstract
ZnO memory device with SnO2 nanocrystals embedded in a biphenyl-tertracarboxylic dianhydride-phenylen diamine polyimide layer was fabricated, and its electrical properties were evaluated. The complementary resistive switching effects with a current bistability appeared during voltage sweeping in the range of +/- 4 V and +/- 5 V, respectively. This switching effect of current-voltage may be originated from a resistance fluctuation due to the charge trapping into SnO2 nanocrystals. In the bipolar resistance switching behavior, the ratio of high-resistance state (HRS) and low-resistance state (LRS) currents was about 4.4 x 10(4) at 1 V. The data retention of LRS/HRS currents was maintained about 2.2 x 10(3) after 10(3) s.
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서울 공과대학 > 서울 신소재공학부 > 1. Journal Articles
서울 자연과학대학 > 서울 물리학과 > 1. Journal Articles

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