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Integrated Fault Detection and Classification of Wafer Bin Maps Using Wavelet Spectrum
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 배석주 | - |
| dc.date.accessioned | 2021-08-02T12:58:35Z | - |
| dc.date.available | 2021-08-02T12:58:35Z | - |
| dc.date.issued | 2019-07-23 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/16494 | - |
| dc.title | Integrated Fault Detection and Classification of Wafer Bin Maps Using Wavelet Spectrum | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | Asia Pacific Conference of the Prognostics and Health Management 2019 | - |
| dc.citation.conferencePlace | Beijing | - |
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Collections - 서울 공과대학 > 서울 산업공학과 > 2. Conference Papers
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Related Researcher
- Bae, Suk Joo
- COLLEGE OF ENGINEERING (DEPARTMENT OF INDUSTRIAL ENGINEERING)