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The piezoresponse force microscopy investigation of self-polarization alignment in poly(vinylidene fluoride-co-trifluoroethylene) ultrathin films

Authors
Park, MoonkyuChoi, Yoon-YoungKim, JiyoonHong, JonginSong, Han WookSung, Tae-HyunNo, Kwangsoo
Issue Date
Jan-2012
Publisher
ROYAL SOC CHEMISTRY
Citation
SOFT MATTER, v.8, no.4, pp.1064 - 1069
Indexed
SCIE
SCOPUS
Journal Title
SOFT MATTER
Volume
8
Number
4
Start Page
1064
End Page
1069
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/166482
DOI
10.1039/c1sm05950e
ISSN
1744-683X
Abstract
We report the self-polarization alignment without external poling in spin-coated poly(vinylidene fluoride-co-trifluoroethylene), P(VDF-TrFE), thin films on transparent and flexible substrates. Piezoresponse force microscopy (PFM) allows the quantitative analysis of preferentially aligned polarization in the ferroelectric thin films. We found that as-received P(VDF-TrFE) thin films on transparent poly(3,4-ethylenedioxythiophene): poly(4-styrenesulfonate) (PEDOT:PSS) electrodes showed stronger self-polarization alignment than those on indium-tin oxide (ITO) electrodes. The relative ratios for the aligned polarization per unit volume on PEDOT: PSS and ITO electrodes were 18.6% and 4%, respectively.
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