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BLUNTNESS MEASUREMENT OF A BERKOVICH INDENTER

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dc.contributor.authorLee, Yun-Hee-
dc.contributor.authorYoo, Byung-Gil-
dc.contributor.authorJang, Jae-Il-
dc.date.accessioned2022-07-16T17:54:38Z-
dc.date.available2022-07-16T17:54:38Z-
dc.date.created2021-05-12-
dc.date.issued2011-12-
dc.identifier.issn0217-9792-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/166995-
dc.description.abstractIndenter blunting is inevitable in nanoindentations and results in unexpected contact properties. Both relaxation of the indentation size effects and deepening of the substrate effects under a blunted indenter cause a change of the bathtub-shaped hardness with indentation depth in a soft film on hard substrate. Thus an identification of three-dimensional morphology of an indenter apex is necessary for precise measurements of hardness in thin films. We observed an actual Berkovich indenter using an atomic force microscope (AFM). Through a quantitative analysis on the AFM image, data pairs of contact area versus contact depth were obtained; curvature radius of the apex was estimated by searching a sphere well-fitted to the indenter apex morphology. The estimated curvature radius and blunted height were 1043.9 +/- 50.9 nm and 44.4 nm, respectively. By comparing with the result from the modified Kick's law, both blunted heights were comparable each other within a 7 nm difference. This confirms validity of the direct observation method with the AFM.-
dc.language영어-
dc.language.isoen-
dc.publisherWORLD SCIENTIFIC PUBL CO PTE LTD-
dc.titleBLUNTNESS MEASUREMENT OF A BERKOVICH INDENTER-
dc.typeArticle-
dc.contributor.affiliatedAuthorJang, Jae-Il-
dc.identifier.doi10.1142/S0217979211066751-
dc.identifier.scopusid2-s2.0-84855219487-
dc.identifier.wosid000298751500032-
dc.identifier.bibliographicCitationINTERNATIONAL JOURNAL OF MODERN PHYSICS B, v.25, no.31, pp.4273 - 4276-
dc.relation.isPartOfINTERNATIONAL JOURNAL OF MODERN PHYSICS B-
dc.citation.titleINTERNATIONAL JOURNAL OF MODERN PHYSICS B-
dc.citation.volume25-
dc.citation.number31-
dc.citation.startPage4273-
dc.citation.endPage4276-
dc.type.rimsART-
dc.type.docTypeArticle; Proceedings Paper-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.relation.journalWebOfScienceCategoryPhysics, Mathematical-
dc.subject.keywordPlusNANOINDENTATION-
dc.subject.keywordPlusHARDNESS-
dc.subject.keywordPlusLOAD-
dc.subject.keywordAuthorNanoindentation-
dc.subject.keywordAuthorAtomic force microscopy (AFM)-
dc.subject.keywordAuthorBerkovich indenter-
dc.subject.keywordAuthorApex bluntness-
dc.identifier.urlhttps://www.worldscientific.com/doi/abs/10.1142/S0217979211066751-
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COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)
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