BLUNTNESS MEASUREMENT OF A BERKOVICH INDENTER
DC Field | Value | Language |
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dc.contributor.author | Lee, Yun-Hee | - |
dc.contributor.author | Yoo, Byung-Gil | - |
dc.contributor.author | Jang, Jae-Il | - |
dc.date.accessioned | 2022-07-16T17:54:38Z | - |
dc.date.available | 2022-07-16T17:54:38Z | - |
dc.date.created | 2021-05-12 | - |
dc.date.issued | 2011-12 | - |
dc.identifier.issn | 0217-9792 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/166995 | - |
dc.description.abstract | Indenter blunting is inevitable in nanoindentations and results in unexpected contact properties. Both relaxation of the indentation size effects and deepening of the substrate effects under a blunted indenter cause a change of the bathtub-shaped hardness with indentation depth in a soft film on hard substrate. Thus an identification of three-dimensional morphology of an indenter apex is necessary for precise measurements of hardness in thin films. We observed an actual Berkovich indenter using an atomic force microscope (AFM). Through a quantitative analysis on the AFM image, data pairs of contact area versus contact depth were obtained; curvature radius of the apex was estimated by searching a sphere well-fitted to the indenter apex morphology. The estimated curvature radius and blunted height were 1043.9 +/- 50.9 nm and 44.4 nm, respectively. By comparing with the result from the modified Kick's law, both blunted heights were comparable each other within a 7 nm difference. This confirms validity of the direct observation method with the AFM. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | WORLD SCIENTIFIC PUBL CO PTE LTD | - |
dc.title | BLUNTNESS MEASUREMENT OF A BERKOVICH INDENTER | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Jang, Jae-Il | - |
dc.identifier.doi | 10.1142/S0217979211066751 | - |
dc.identifier.scopusid | 2-s2.0-84855219487 | - |
dc.identifier.wosid | 000298751500032 | - |
dc.identifier.bibliographicCitation | INTERNATIONAL JOURNAL OF MODERN PHYSICS B, v.25, no.31, pp.4273 - 4276 | - |
dc.relation.isPartOf | INTERNATIONAL JOURNAL OF MODERN PHYSICS B | - |
dc.citation.title | INTERNATIONAL JOURNAL OF MODERN PHYSICS B | - |
dc.citation.volume | 25 | - |
dc.citation.number | 31 | - |
dc.citation.startPage | 4273 | - |
dc.citation.endPage | 4276 | - |
dc.type.rims | ART | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.relation.journalWebOfScienceCategory | Physics, Mathematical | - |
dc.subject.keywordPlus | NANOINDENTATION | - |
dc.subject.keywordPlus | HARDNESS | - |
dc.subject.keywordPlus | LOAD | - |
dc.subject.keywordAuthor | Nanoindentation | - |
dc.subject.keywordAuthor | Atomic force microscopy (AFM) | - |
dc.subject.keywordAuthor | Berkovich indenter | - |
dc.subject.keywordAuthor | Apex bluntness | - |
dc.identifier.url | https://www.worldscientific.com/doi/abs/10.1142/S0217979211066751 | - |
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