BLUNTNESS MEASUREMENT OF A BERKOVICH INDENTER
- Authors
- Lee, Yun-Hee; Yoo, Byung-Gil; Jang, Jae-Il
- Issue Date
- Dec-2011
- Publisher
- WORLD SCIENTIFIC PUBL CO PTE LTD
- Keywords
- Nanoindentation; Atomic force microscopy (AFM); Berkovich indenter; Apex bluntness
- Citation
- INTERNATIONAL JOURNAL OF MODERN PHYSICS B, v.25, no.31, pp.4273 - 4276
- Indexed
- SCIE
SCOPUS
- Journal Title
- INTERNATIONAL JOURNAL OF MODERN PHYSICS B
- Volume
- 25
- Number
- 31
- Start Page
- 4273
- End Page
- 4276
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/166995
- DOI
- 10.1142/S0217979211066751
- ISSN
- 0217-9792
- Abstract
- Indenter blunting is inevitable in nanoindentations and results in unexpected contact properties. Both relaxation of the indentation size effects and deepening of the substrate effects under a blunted indenter cause a change of the bathtub-shaped hardness with indentation depth in a soft film on hard substrate. Thus an identification of three-dimensional morphology of an indenter apex is necessary for precise measurements of hardness in thin films. We observed an actual Berkovich indenter using an atomic force microscope (AFM). Through a quantitative analysis on the AFM image, data pairs of contact area versus contact depth were obtained; curvature radius of the apex was estimated by searching a sphere well-fitted to the indenter apex morphology. The estimated curvature radius and blunted height were 1043.9 +/- 50.9 nm and 44.4 nm, respectively. By comparing with the result from the modified Kick's law, both blunted heights were comparable each other within a 7 nm difference. This confirms validity of the direct observation method with the AFM.
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