Small-Molecule Nonvolatile Memory Cells Embedded with Ti Nanocrystals Surrounded by TiO2 Tunneling Barrier
DC Field | Value | Language |
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dc.contributor.author | Nam, Woo-Sik | - |
dc.contributor.author | Shim, Tae-Hun | - |
dc.contributor.author | Park, Jea-Gun | - |
dc.date.accessioned | 2022-07-16T18:54:27Z | - |
dc.date.available | 2022-07-16T18:54:27Z | - |
dc.date.created | 2021-05-12 | - |
dc.date.issued | 2011-10 | - |
dc.identifier.issn | 1882-0778 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/167493 | - |
dc.description.abstract | We developed cross-bar 4F(2) small-molecule nonvolatile memory-cells embedded with Ti nanocrystals surrounded by a TiO2 tunneling barrier. The Ti nanocrystals size and distribution were primarily determined by the Ti layer evaporation rate followed by in-situ O-2-plasma oxidation; i.e., the size increased with the evaporation rate and the size uniformity of Ti nanocrystals became better as the evaporation rate increased from 0.1-2.0 angstrom/s, then became worse as the evaporation rate increased above 2.0 angstrom/s. At a specific evaporation rate, small-molecule memory-cells embedded with Ti nanocrystals demonstrated typical nonvolatile memory characteristics, such as symmetrical current vs voltage (I-V) characteristics, I-on/I-off ratio of 4.2 x 10(2), stable retention time, and program/erase cycles. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | IOP PUBLISHING LTD | - |
dc.title | Small-Molecule Nonvolatile Memory Cells Embedded with Ti Nanocrystals Surrounded by TiO2 Tunneling Barrier | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Park, Jea-Gun | - |
dc.identifier.doi | 10.1143/APEX.4.105003 | - |
dc.identifier.scopusid | 2-s2.0-80054088072 | - |
dc.identifier.wosid | 000296083900021 | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS EXPRESS, v.4, no.10, pp.1 - 3 | - |
dc.relation.isPartOf | APPLIED PHYSICS EXPRESS | - |
dc.citation.title | APPLIED PHYSICS EXPRESS | - |
dc.citation.volume | 4 | - |
dc.citation.number | 10 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 3 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | Current voltage characteristics | - |
dc.subject.keywordPlus | Evaporation | - |
dc.subject.keywordPlus | Molecules | - |
dc.subject.keywordPlus | Phase transitions | - |
dc.subject.keywordPlus | Titanium | - |
dc.subject.keywordPlus | Titanium dioxide | - |
dc.identifier.url | https://iopscience.iop.org/article/10.1143/APEX.4.105003 | - |
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