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The effect of surface treatment of bottom contact organic thin film transistor

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dc.contributor.authorPark, Jin-Seong-
dc.contributor.authorJeon, Woo Sik-
dc.contributor.authorPark, Jung Soo-
dc.contributor.authorKwon, Jang Hyuk-
dc.contributor.authorSuh, Min Chul-
dc.date.accessioned2022-07-16T19:01:51Z-
dc.date.available2022-07-16T19:01:51Z-
dc.date.created2021-05-13-
dc.date.issued2011-09-
dc.identifier.issn0379-6779-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/167568-
dc.description.abstractA bottom contact organic thin film transistor (OTFT) is fabricated with an organic double-layered gate insulator (Cl) and pentacene. Poly(methyl methacrylate) (PMMA) and 2-mercapto 5-nitrobenzimidazole (MNB) layers are deposited on the gate insulator and source/drain gold (S/D. Au) electrode before depositing pentacene to investigate the device properties. The sequence of surface treatment significantly affects the device performance. The ultra-thin PMMA (less than 5 nm) was deposited on the organic gate insulator and S/D metal by the spin coating method, which caused no deterioration of the on-state current (I(on)), although a bottom contact structure was exploited. The lack of increase in the contact resistance (R(c)) may be due to the difference in wettability between PMMA/Au and PMMA/organic Cl. As a result, the devices treated with PMMA -˃ MNB showed much better I(on) behavior than those fabricated with MNB -˃ PMMA. We report on the difference in the physical and electrical performances associated with the surface treatment sequence.-
dc.language영어-
dc.language.isoen-
dc.publisherELSEVIER SCIENCE SA-
dc.titleThe effect of surface treatment of bottom contact organic thin film transistor-
dc.typeArticle-
dc.contributor.affiliatedAuthorPark, Jin-Seong-
dc.identifier.doi10.1016/j.synthmet.2011.07.001-
dc.identifier.scopusid2-s2.0-80052266448-
dc.identifier.wosid000295564000025-
dc.identifier.bibliographicCitationSYNTHETIC METALS, v.161, no.17-18, pp.1953 - 1957-
dc.relation.isPartOfSYNTHETIC METALS-
dc.citation.titleSYNTHETIC METALS-
dc.citation.volume161-
dc.citation.number17-18-
dc.citation.startPage1953-
dc.citation.endPage1957-
dc.type.rimsART-
dc.type.docType정기학술지(Article(Perspective Article포함))-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalResearchAreaPolymer Science-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.relation.journalWebOfScienceCategoryPolymer Science-
dc.subject.keywordPlusFIELD-EFFECT TRANSISTORS-
dc.subject.keywordPlusDISPLAYS-
dc.subject.keywordPlusMOBILITY-
dc.subject.keywordPlusSHIFT-
dc.subject.keywordAuthorOrganic thin film transistor (OTFT)-
dc.subject.keywordAuthorPMMA-
dc.subject.keywordAuthorMNB-
dc.subject.keywordAuthorContact resistance-
dc.subject.keywordAuthorSequence of surface treatment-
dc.subject.keywordAuthorWettability-
dc.identifier.urlhttps://www.sciencedirect.com/science/article/pii/S0379677911002931?via%3Dihub-
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