The influence of visible light on the gate bias instability of In-Ga-Zn-O thin film transistors
DC Field | Value | Language |
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dc.contributor.author | Kim, Sangwook | - |
dc.contributor.author | Kim, Sunil | - |
dc.contributor.author | Kim, Changjung | - |
dc.contributor.author | Park, JaeChul | - |
dc.contributor.author | Song, Ihun | - |
dc.contributor.author | Jeon, Sanghun | - |
dc.contributor.author | Ahn, Seung-Eon | - |
dc.contributor.author | Park, Jin-Seong | - |
dc.contributor.author | Jeong, Jae Kyeong | - |
dc.date.accessioned | 2022-07-16T19:19:38Z | - |
dc.date.available | 2022-07-16T19:19:38Z | - |
dc.date.created | 2021-05-13 | - |
dc.date.issued | 2011-08 | - |
dc.identifier.issn | 0038-1101 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/167745 | - |
dc.description.abstract | We investigated the effect of photon irradiation with various energies on the gate bias instability of indium-gallium-zinc oxide transistors. The illumination of red and green light on the transistor caused positive threshold voltage (V(th)) shifts of 0.23 V and 0.18 V. respectively, while it did not affect the V(th) value in blue light after a positive bias stress. However, the stability of transistors was deteriorated with increasing photon energy after a negative bias stress: negative V(th) shifts for red (-0.23 V) and blue light (-3.7 V). This difference can be explained by the compensation effect of the electron carrier trapping and the creation of meta-stable donors via photon excitation. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
dc.title | The influence of visible light on the gate bias instability of In-Ga-Zn-O thin film transistors | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Park, Jin-Seong | - |
dc.identifier.doi | 10.1016/j.sse.2011.04.014 | - |
dc.identifier.scopusid | 2-s2.0-79957953431 | - |
dc.identifier.wosid | 000292444000013 | - |
dc.identifier.bibliographicCitation | SOLID-STATE ELECTRONICS, v.62, no.1, pp.77 - 81 | - |
dc.relation.isPartOf | SOLID-STATE ELECTRONICS | - |
dc.citation.title | SOLID-STATE ELECTRONICS | - |
dc.citation.volume | 62 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 77 | - |
dc.citation.endPage | 81 | - |
dc.type.rims | ART | - |
dc.type.docType | 정기학술지(Article(Perspective Article포함)) | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.subject.keywordPlus | Gallium | - |
dc.subject.keywordPlus | Indium | - |
dc.subject.keywordPlus | Irradiation | - |
dc.subject.keywordPlus | Photons | - |
dc.subject.keywordPlus | Stability | - |
dc.subject.keywordPlus | Thin film devices | - |
dc.subject.keywordPlus | Thin film transistors | - |
dc.subject.keywordPlus | Thin films | - |
dc.subject.keywordPlus | Zinc | - |
dc.subject.keywordPlus | Zinc oxide | - |
dc.subject.keywordPlus | Transistors | - |
dc.subject.keywordPlus | Bias instability | - |
dc.subject.keywordPlus | Blue light | - |
dc.subject.keywordPlus | Compensation effects | - |
dc.subject.keywordPlus | Electron carrier | - |
dc.subject.keywordPlus | Gate bias | - |
dc.subject.keywordPlus | Green light | - |
dc.subject.keywordPlus | InGaZnO | - |
dc.subject.keywordPlus | Meta-stable | - |
dc.subject.keywordPlus | Negative bias | - |
dc.subject.keywordPlus | Negative V | - |
dc.subject.keywordPlus | Photon energy | - |
dc.subject.keywordPlus | Photon excitations | - |
dc.subject.keywordPlus | Photon irradiation | - |
dc.subject.keywordPlus | Positive bias | - |
dc.subject.keywordPlus | Visible light | - |
dc.subject.keywordAuthor | InGaZnO | - |
dc.subject.keywordAuthor | Thin film transistor | - |
dc.subject.keywordAuthor | Photon irradiation | - |
dc.subject.keywordAuthor | Bias instability | - |
dc.identifier.url | https://www.sciencedirect.com/science/article/pii/S0038110111001481?via%3Dihub | - |
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