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Dynamic characteristics measurement of thin semiconductor layer
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Buhm | - |
| dc.contributor.author | Lee, Soonbok | - |
| dc.contributor.author | Kim, Hyungik | - |
| dc.contributor.author | Park, Jun hong | - |
| dc.date.accessioned | 2022-07-16T19:45:00Z | - |
| dc.date.available | 2022-07-16T19:45:00Z | - |
| dc.date.created | 2021-05-11 | - |
| dc.date.issued | 2011-08 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/167922 | - |
| dc.language | 영어 | - |
| dc.language.iso | en | - |
| dc.publisher | ICCM | - |
| dc.title | Dynamic characteristics measurement of thin semiconductor layer | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Park, Jun hong | - |
| dc.identifier.scopusid | 2-s2.0-84875934827 | - |
| dc.identifier.bibliographicCitation | ICCM International Conferences on Composite Materials, pp.1 - 2 | - |
| dc.relation.isPartOf | ICCM International Conferences on Composite Materials | - |
| dc.citation.title | ICCM International Conferences on Composite Materials | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 2 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Conference Paper | - |
| dc.description.journalClass | 1 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.subject.keywordAuthor | Ultra-thin layer | - |
| dc.subject.keywordAuthor | Transfer function method | - |
| dc.subject.keywordAuthor | Multi-layerd semiconductor | - |
| dc.subject.keywordAuthor | Young’s modulus | - |
| dc.subject.keywordAuthor | Loss factor | - |
| dc.identifier.url | http://www.iccm-central.org/Proceedings/ICCM18proceedings/data/2.%20Oral%20Presentation/Aug24(Wednesday)/W10%20Mechanical%20and%20Physical%20Properties/W10-5-IK1304.pdf | - |
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Related Researcher
- Park, Jun hong
- COLLEGE OF ENGINEERING (SCHOOL OF MECHANICAL ENGINEERING)