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Dynamic characteristics measurement of thin semiconductor layer
- Authors
- Park, Buhm; Lee, Soonbok; Kim, Hyungik; Park, Jun hong
- Issue Date
- Aug-2011
- Publisher
- ICCM
- Keywords
- Ultra-thin layer; Transfer function method; Multi-layerd semiconductor; Young’s modulus; Loss factor
- Citation
- ICCM International Conferences on Composite Materials, pp.1 - 2
- Indexed
- SCOPUS
- Journal Title
- ICCM International Conferences on Composite Materials
- Start Page
- 1
- End Page
- 2
- Files in This Item
- Go to Link
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Collections - 서울 공과대학 > 서울 기계공학부 > 1. Journal Articles
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Related Researcher
- Park, Jun hong
- COLLEGE OF ENGINEERING (SCHOOL OF MECHANICAL ENGINEERING)