High-Performance p-Channel Tellurium Thin-Film Transistor Applications Fabricated at a Low Temperature of 150 °C
DC Field | Value | Language |
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dc.contributor.author | Kim, Taikyu | - |
dc.contributor.author | Choi, Cheol Hee | - |
dc.contributor.author | Jeong, Jae Kyeong | - |
dc.date.accessioned | 2022-09-19T13:40:19Z | - |
dc.date.available | 2022-09-19T13:40:19Z | - |
dc.date.created | 2022-09-08 | - |
dc.date.issued | 2022-06 | - |
dc.identifier.issn | 0097-966X | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/171601 | - |
dc.description.abstract | Development of high-performance p-channel thin-film transistors (TFTs) can be an essential building block for next-generation display technologies which require a great power efficiency. While an n-channel In GaZnO TFT has been practically demonstrated, the counterparts are still challenging because of their ionic bonding nature. Here we report high-performance p-channel hexagonal tellurium (Te) TFT which exhibits outstanding device performances with a field-effect mobility of 21.2 cm2/Vs, a current modulation ratio of 2.3 × 10s, a subthreshold swing of 0.2 V/dec, and a threshold voltage of -0.3 V. This study shows a strong potential of p-channel Te TFT for next-generation display applications. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | John Wiley and Sons Inc | - |
dc.title | High-Performance p-Channel Tellurium Thin-Film Transistor Applications Fabricated at a Low Temperature of 150 °C | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Jeong, Jae Kyeong | - |
dc.identifier.doi | 10.1002/sdtp.15459 | - |
dc.identifier.scopusid | 2-s2.0-85135615959 | - |
dc.identifier.bibliographicCitation | Digest of Technical Papers - SID International Symposium, v.53, no.1, pp.225 - 227 | - |
dc.relation.isPartOf | Digest of Technical Papers - SID International Symposium | - |
dc.citation.title | Digest of Technical Papers - SID International Symposium | - |
dc.citation.volume | 53 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 225 | - |
dc.citation.endPage | 227 | - |
dc.type.rims | ART | - |
dc.type.docType | Conference Paper | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | CMOS integrated circuits | - |
dc.subject.keywordPlus | Field effect transistors | - |
dc.subject.keywordPlus | Tellurium | - |
dc.subject.keywordPlus | Tellurium compounds | - |
dc.subject.keywordPlus | Temperature | - |
dc.subject.keywordPlus | Thin film circuits | - |
dc.subject.keywordPlus | Thin films | - |
dc.subject.keywordPlus | Threshold voltage | - |
dc.subject.keywordPlus | Thin film transistors | - |
dc.subject.keywordPlus | C. thin film transistor (TFT) | - |
dc.subject.keywordPlus | CMOS thin-film transistor | - |
dc.subject.keywordPlus | Inorganic p-type semiconductor | - |
dc.subject.keywordPlus | Inorganics | - |
dc.subject.keywordPlus | Lows-temperatures | - |
dc.subject.keywordPlus | P channels | - |
dc.subject.keywordPlus | P type semiconductor | - |
dc.subject.keywordPlus | Performance | - |
dc.subject.keywordPlus | Thin-film transistor | - |
dc.subject.keywordAuthor | CMOS TFT | - |
dc.subject.keywordAuthor | Inorganic p-type semiconductor | - |
dc.subject.keywordAuthor | Tellurium | - |
dc.subject.keywordAuthor | Thin-film transistor (TFT) | - |
dc.identifier.url | https://sid.onlinelibrary.wiley.com/doi/10.1002/sdtp.15459 | - |
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