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Analysis of parasitic effects in ultra wideband low noise amplifier based on em simulation

Authors
Seong, NackgyunLee, YoungseongJang, YohanChoi, Jaehoon
Issue Date
Dec-2010
Publisher
IEICE
Keywords
EM-based modeling approach; layout interconnect effect; RF CMOS Integrated circuit; UWB LNA
Citation
Asia-Pacific Microwave Conference Proceedings, APMC, pp.374 - 377
Indexed
SCOPUS
Journal Title
Asia-Pacific Microwave Conference Proceedings, APMC
Start Page
374
End Page
377
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/173333
ISSN
0000-0000
Abstract
Layout parasitic effects can significantly affect the performance of CMOS RF integrated circuits such as low noise amplifier (LNA), mixer and etc. Therefore, the analysis of parasitic effects of layout in CMOS process has become very important. In this paper, we studied a fast approach to predict the parasitic effects of an on-chip interconnect structure based on EM simulation. This approach is applied to analyze the parasitic effects in ultra wideband (UWB) LNA design. Numerical results reveal that the parasitic effects of interconnect is very critical to maintain the desired performance of a UWB LNA.
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서울 공과대학 > 서울 융합전자공학부 > 1. Journal Articles

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